Investigation of the Effect of Solvent and Heat Treatment Process on Structural Properties of MoS2 Thin Films

Abstract

In recent years, transition metal dichalcogenides (TMDCs) have become one of the most studied material groups due to their unique physical and chemical properties. The TMDCs are frequently used in optoelectronic applications, hydrogen evolution reactions, energy storage systems, solar cells, and radar absorbing systems. In this study, the structural properties of MoS2 thin films, belonging to one of the TMDCs group, produced by using different solvents and heat treatment processes were investigated. Thin films were produced by using the sol-gel spin coating technique. The crystallization of the films was ensured at different heat treatment temperature values under a vacuum atmosphere by introducing N2 gas flow. The effects of the heat treatment temperature and chemical solvent were evaluated by the structural characterizations techniques. Within this scope, the X-ray diffraction method (XRD), Raman scattering, and scanning electron microscope (SEM) were used to investigate the structural properties of films.