Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.13091/3723
Title: The Effect of Hardware Impairments on the Error Bounds of Localization and Maximum Likelihood Estimation of <inline-formula><tex-math notation="LaTeX">$mm$</tex-math></inline-formula>-Wave MISO-OFDM Systems
Authors: Tubail, D.
Ceniklioğlu, B.
Canbilen, A.E.
Develi, I.
Ikki, S.S.
Keywords: 5G
estimation
Fisher information matrix
Hardware
hardware impairments
localization
Location awareness
maximum likelihood
Maximum likelihood detection
Maximum likelihood estimation
Nonlinear filters
OFDM
Signal to noise ratio
5G mobile communication systems
Computer hardware
Error analysis
Estimation
Fisher information matrix
Matrix algebra
Maximum likelihood estimation
Nonlinear filtering
Orthogonal frequency division multiplexing
5g
Fisher information matrices
Hardware
Hardware impairment
Localisation
Location awareness
Ma ximum likelihoods
Maximum- likelihood detection
Maximum-likelihood
Maximum-likelihood estimation
Nonlinear filter
Signal to noise ratio
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: This work investigates the localization process in milimeter-wave (<inline-formula><tex-math notation="LaTeX">$mm$</tex-math></inline-formula>-Wave) multiple-input single-output (MISO) OFDM systems considering hardware impairments (HWIs) at both the base station (BS) and the mobile station (MS). The localization is performed on MS board by estimating the downlink channel parameters using a maximum likelihood (ML) estimator, and then transforming them to the localization parameters. Besides, the Fisher information matrix (FIM) is utilized to assess the accuracy of the estimation processes. The limits of the localization is calculated in terms of the position error bound (PEB). The obtained results of the computer simulations show the destructive impacts of the HWIs on the localization process with respect to the effective SNR, and the number of pilot transmissions, transmitter antennas and subcarriers. IEEE
URI: https://doi.org/10.1109/TVT.2022.3218048
https://hdl.handle.net/20.500.13091/3723
ISSN: 0018-9545
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collections
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collections

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