Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.13091/5029
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dc.contributor.authorSeyfi, G.-
dc.contributor.authorYilmaz, M.-
dc.contributor.authorEsme, E.-
dc.contributor.authorKiran, M.S.-
dc.date.accessioned2024-01-23T09:29:43Z-
dc.date.available2024-01-23T09:29:43Z-
dc.date.issued2024-
dc.identifier.issn1568-4946-
dc.identifier.urihttps://doi.org/10.1016/j.asoc.2023.111133-
dc.identifier.urihttps://hdl.handle.net/20.500.13091/5029-
dc.description.abstractX-ray imaging technologies find applications across various domains, including medical imaging in health institutions or security in military facilities and public institutions. X-ray images acquired from diverse sources necessitate analysis by either trained human experts or automated systems. In cases where concealed electronic cards potentially pose threats, such as in laptops harboring explosive triggering circuits, conventional analysis methods are challenging to detect, even when scrutinized by skilled. The present investigation is centered on the utilization of deep learning algorithms for the analysis of X-ray images of laptop computers, with the aim of identifying concealed hazardous components. To construct the dataset, some control cards such as Arduino, Raspberry Pi and Bluetooth circuits were hidden inside the 60 distinct laptop computers and were subjected to X-ray imaging, yielding a total of 5094 X-ray images. The primary objective of this study is to distinguish laptops based on the presence or absence of concealed electronic cards. To this end, a suite of deep learning models, including EfficientNet, DenseNet, DarkNet19, DarkNet53, Inception, MobileNet, ResNet18, ResNet50, ResNet101, ShuffleNet and Xception were subjected to training, testing, and comparative evaluation. The performance of these models was assessed utilizing a range of metrics, encompassing accuracy, sensitivity, specificity, precision, f-measure, and g-mean. Among the various models examined, the ShuffleNet model emerged as the top-performing one, yielding superior results in terms of accuracy (0.8355), sensitivity (0.8199), specificity (0.8530), precision (0.8490), f-measure (0.8322), and g-mean (0.8352). © 2023 Elsevier B.V.en_US
dc.description.sponsorshipTürkiye Bilimsel ve Teknolojik Araştırma Kurumu, TÜBİTAK: 122E024en_US
dc.language.isoenen_US
dc.publisherElsevier Ltden_US
dc.relation.ispartofApplied Soft Computingen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectClassificationen_US
dc.subjectDangerous substanceen_US
dc.subjectDeep learningen_US
dc.subjectX-ray imageen_US
dc.subjectAutomationen_US
dc.subjectDeep learningen_US
dc.subjectExplosivesen_US
dc.subjectImage analysisen_US
dc.subjectImage classificationen_US
dc.subjectLearning algorithmsen_US
dc.subjectLearning systemsen_US
dc.subjectMedical imagingen_US
dc.subjectMilitary applicationsen_US
dc.subjectMilitary photographyen_US
dc.subjectTiming circuitsen_US
dc.subjectDangerous substancesen_US
dc.subjectDeep learningen_US
dc.subjectElectronic cardsen_US
dc.subjectF measureen_US
dc.subjectG-meansen_US
dc.subjectImage-analysisen_US
dc.subjectMilitary facilitiesen_US
dc.subjectShuffleNetsen_US
dc.subjectX-ray imageen_US
dc.subjectX-ray imaging technologiesen_US
dc.subjectLaptop computersen_US
dc.titleX-ray image analysis for explosive circuit detection using deep learning algorithmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.asoc.2023.111133-
dc.identifier.scopus2-s2.0-85180362802en_US
dc.departmentKTÜNen_US
dc.identifier.volume151en_US
dc.identifier.wosWOS:001137484800001en_US
dc.institutionauthor-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.authorscopusid58576350300-
dc.authorscopusid58587037700-
dc.authorscopusid57189468408-
dc.authorscopusid54403096500-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairetypeArticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collections
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collections
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