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Title: Analysis of Average Bit Error Rate for OFDM-IM Systems with Hardware Impairments over Nakagami-m and Weibull Fading Channels
Authors: Ceniklioğlu, Büşra
Develi, I.
Canbilen, Ayşe Elif
Lafcı, Mustafa
Keywords: Bit error rate
Energy efficiency
Fading channels
Maximum likelihood
Average bit-error rates
High energy efficiency
Index modulation
Modulation systems
Multiplexing schemes
Nakagami-m fading channels
Orthogonal frequency-division multiplexing
Systems performance
Weibull fading channel
Orthogonal frequency division multiplexing
Issue Date: 2022
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Orthogonal frequency division multiplexing together with index modulation (OFDM-IM) is a brilliant key alternative to the traditional orthogonal frequency division multiplexing (OFDM) schemes for future communication technologies whereby it has high spectral and energy efficiency. However, there are still key issues that need to be adressed to evaluate possible applications in practical systems. Accordingly, we investigate the performance of OFDM-IM systems over Nakagami-m and Weibull fading channels that suffer from transceiver hardware impairments (HWIs) in this paper. Specifically, a maximum likelihood (ML) detector is applied for OFDM-IM-based transmission and the system performance is analyzed under the effect of HWIs considering average bit error rate (ABER) by utilizing computer simulations. The obtained results show that the HWIs have serious destructive effects on the overall system performance. © 2022 IEEE.
Description: 2022 International Conference on Computing, Communication, Security and Intelligent Systems, IC3SIS 2022 -- 23 June 2022 through 25 June 2022 -- 182792
ISBN: 9781665468831
Appears in Collections:Mühendislik ve Doğa Bilimleri Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collections

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