Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.13091/371
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dc.contributor.authorCihan, Mücahit-
dc.contributor.authorCeylan, Murat-
dc.date.accessioned2021-12-13T10:24:06Z-
dc.date.available2021-12-13T10:24:06Z-
dc.date.issued2021-
dc.identifier.isbn9781665436496-
dc.identifier.urihttps://doi.org/10.1109/SIU53274.2021.9477861-
dc.identifier.urihttps://hdl.handle.net/20.500.13091/371-
dc.description29th IEEE Conference on Signal Processing and Communications Applications, SIU 2021 -- 9 June 2021 through 11 June 2021 -- -- 170536en_US
dc.description.abstractHyperspectral imaging (HSI) is an imaging method that enables to obtain a large number of two-dimensional images in a wide wavelength range in the electromagnetic spectrum band. HSI has an important potential in biomedical applications as it provides diagnostic information about tissue physiology, morphology and composition. In this study, spectral signatures of unhealthy and healthy neonates were extracted using HSI method. Then, data statistics (minimum, maximum, mean, median and standard deviation) of these signatures were obtained and classified with Linear Discriminant Analysis, Support Vector Machines and Naive Bayes Methods. After the classification processes, the best result was achieved using Linear Discriminant Analysis with 90.63% accuracy, 87.50% sensitivity and 93.75% specificity. © 2021 IEEE.en_US
dc.language.isotren_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartofSIU 2021 - 29th IEEE Conference on Signal Processing and Communications Applications, Proceedingsen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectClassificationen_US
dc.subjectHyperspectral imagingen_US
dc.subjectMachine learning methodsen_US
dc.subjectNeonatal spectral signatureen_US
dc.titleComparison of linear discriminant analysis, support vector machines and naive bayes methods in the classification of neonatal hyperspectral signaturesen_US
dc.title.alternativeYenido?an hiperspektral imzalarinin siniflandirilmasinda lineer diskriminant analizi, destek vektör makineleri ve naive bayes yöntemlerinin karşilaştirilmasien_US
dc.typeConference Objecten_US
dc.identifier.doi10.1109/SIU53274.2021.9477861-
dc.identifier.scopus2-s2.0-85111451769en_US
dc.departmentFakülteler, Mühendislik ve Doğa Bilimleri Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.identifier.wosWOS:000808100700104en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.authorscopusid57226111647-
dc.authorscopusid56276648900-
item.languageiso639-1tr-
item.fulltextWith Fulltext-
item.cerifentitytypePublications-
item.openairetypeConference Object-
item.grantfulltextembargo_20300101-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
crisitem.author.dept02.04. Department of Electrical and Electronics Engineering-
Appears in Collections:Mühendislik ve Doğa Bilimleri Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collections
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collections
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