Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.13091/3243
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dc.contributor.authorToprak, Rabia-
dc.contributor.authorGültekin, Seyfettin Sinan-
dc.contributor.authorUzer, Dilek-
dc.date.accessioned2022-11-28T16:57:10Z-
dc.date.available2022-11-28T16:57:10Z-
dc.date.issued2022-
dc.identifier.isbn9781665450928-
dc.identifier.urihttps://doi.org/10.1109/SIU55565.2022.9864827-
dc.identifier.urihttps://doi.org/10.1109/SIU55565.2022.9864827-
dc.identifier.urihttps://hdl.handle.net/20.500.13091/3243-
dc.description30th Signal Processing and Communications Applications Conference, SIU 2022 -- 15 May 2022 through 18 May 2022 -- 182415en_US
dc.description.abstractPathology science has an important place in the medical field. Its importance is increasing day by day because it evaluates the information about diseases at the cellular level. The reports prepared from the tissue samples examined by the pathologists contain very important information for both the patient and the doctor. This information may include the level of the disease and the mode of treatment. Therefore, the time to reach the pathological reports is important. Microstrip patch antennas are used for various purposes in the biomedical field. In this study, the far and near field outputs of the evaluations of the pathological tissue samples were tested with the microstrip patch antenna structure. For this, a microstrip patch antenna with an operating frequency of 2.45 GHz was used. Pathological tissue samples were modeled in the free-space measurement technique created using the antenna structure. The electric field and scattering parameter values obtained as a result of the simulations using the Ansys HFSS program were evaluated for the near and far field. When the evaluation results are examined, it has been shown that near field measurements for electric field data and far field measurements for scattering parameter data are more efficient. © 2022 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartof2022 30th Signal Processing and Communications Applications Conference, SIU 2022en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectfar fielden_US
dc.subjectmicrostrip patch antennaen_US
dc.subjectnear fielden_US
dc.subjectPathologyen_US
dc.subjectElectric fieldsen_US
dc.subjectMicrostrip antennasen_US
dc.subjectMicrowave antennasen_US
dc.subjectScattering parametersen_US
dc.subjectSlot antennasen_US
dc.subjectTissueen_US
dc.subjectTissue engineeringen_US
dc.subjectAntenna structuresen_US
dc.subjectFar-fielden_US
dc.subjectField valuesen_US
dc.subjectMedical fieldsen_US
dc.subjectMicro-strip patch antennasen_US
dc.subjectMicrostrip-patch antennaen_US
dc.subjectNear fieldsen_US
dc.subjectPathological tissueen_US
dc.subjectSkin tissueen_US
dc.subjectTissue samplesen_US
dc.subjectPathologyen_US
dc.titleComparison of Far Field and Near Field Values of Skin Tissue Measured Using Microstrip Antenna Structureen_US
dc.title.alternativeMikroşerit Anten Yapisi Kullanilarak Ölçülen Deri Dokusuna ait Uzak Alan ve Yakin Alan De?erlerinin Kiyaslanmasien_US
dc.typeConference Objecten_US
dc.identifier.doi10.1109/SIU55565.2022.9864827-
dc.identifier.scopus2-s2.0-85138691264en_US
dc.departmentFakülteler, Mühendislik ve Doğa Bilimleri Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.institutionauthorGültekin, Seyfettin Sinan-
dc.institutionauthorUzer, Dilek-
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.authorscopusid57904164100-
dc.authorscopusid7003645238-
dc.authorscopusid49862233600-
item.openairetypeConference Object-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.grantfulltextembargo_20300101-
item.fulltextWith Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
crisitem.author.dept02.04. Department of Electrical and Electronics Engineering-
Appears in Collections:Mühendislik ve Doğa Bilimleri Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collections
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