Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.13091/3243
Title: Comparison of Far Field and Near Field Values of Skin Tissue Measured Using Microstrip Antenna Structure
Other Titles: Mikroşerit Anten Yapisi Kullanilarak Ölçülen Deri Dokusuna ait Uzak Alan ve Yakin Alan De?erlerinin Kiyaslanmasi
Authors: Toprak, Rabia
Gültekin, Seyfettin Sinan
Uzer, Dilek
Keywords: far field
microstrip patch antenna
near field
Pathology
Electric fields
Microstrip antennas
Microwave antennas
Scattering parameters
Slot antennas
Tissue
Tissue engineering
Antenna structures
Far-field
Field values
Medical fields
Micro-strip patch antennas
Microstrip-patch antenna
Near fields
Pathological tissue
Skin tissue
Tissue samples
Pathology
Issue Date: 2022
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Pathology science has an important place in the medical field. Its importance is increasing day by day because it evaluates the information about diseases at the cellular level. The reports prepared from the tissue samples examined by the pathologists contain very important information for both the patient and the doctor. This information may include the level of the disease and the mode of treatment. Therefore, the time to reach the pathological reports is important. Microstrip patch antennas are used for various purposes in the biomedical field. In this study, the far and near field outputs of the evaluations of the pathological tissue samples were tested with the microstrip patch antenna structure. For this, a microstrip patch antenna with an operating frequency of 2.45 GHz was used. Pathological tissue samples were modeled in the free-space measurement technique created using the antenna structure. The electric field and scattering parameter values obtained as a result of the simulations using the Ansys HFSS program were evaluated for the near and far field. When the evaluation results are examined, it has been shown that near field measurements for electric field data and far field measurements for scattering parameter data are more efficient. © 2022 IEEE.
Description: 30th Signal Processing and Communications Applications Conference, SIU 2022 -- 15 May 2022 through 18 May 2022 -- 182415
URI: https://doi.org/10.1109/SIU55565.2022.9864827
https://doi.org/10.1109/SIU55565.2022.9864827
https://hdl.handle.net/20.500.13091/3243
ISBN: 9781665450928
Appears in Collections:Mühendislik ve Doğa Bilimleri Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collections

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